Abstract
Majorana zero modes are predicted to emerge in superconductor/semiconductor interfaces, such as Al/InAs. Majorana modes could be utilized for fault tolerant topological qubits. However, their realization is hindered by materials challenges. The coupling between the superconductor and the semiconductor may be too strong for Majorana modes to emerge, due to effective doping of the semiconductor by the metallic contact. This could be mediated by adding a tunnel barrier of controlled thickness. We use density functional theory (DFT) with Hubbard U corrections, whose values are machine-learned via Bayesian optimization (BO) to assess ZnTe and CdSe as prospective tunnel barriers for the InAs/Al interface. The results of DFT+U(BO) for ZnTe are validated by comparison to angle resolved photoemission spectroscopy (ARPES). We then study bilayer interfaces of the three semiconductors with each other and with Al, as well as tri-layer interfaces with a varying number of ZnTe or CdSe layers inserted between InAs and Al. We find that 16 atomic layers of either material completely insulate the InAs from metal induced gap states (MIGS). However, ZnTe and CdSe differ significantly in their band alignment, such that ZnTe forms an effective barrier for electrons, whereas CdSe forms a barrier for holes. Because of Fermi level pinning in the conduction band at the surface, only electron transport is possible in InAs-based devices. Therefore, ZnTe is the better choice. Based on the results of our simulations, we suggest conducting experiments with ZnTe barriers in the thickness range of 6-18 atomic layers.
Supplementary materials
Title
Supporting Information to: First Principles Assessment of ZnTe and CdSe as Prospective Tunnel Barriers at the InAs/Al Interface
Description
Contents: Effect of lattice parameter on the band structure of ZnTe; Orbital decomposition of the band structures of ZnTe and CdSe obtained with different DFT functionals; Effect of slab thickness on unfolded surface-parallel and surface-perpendicular band structures of ZnTe; Surface matching results for bilayer interfaces; Effect of relaxation on the band alignment at semiconductor interfaces; Element-resolved band structures of semiconductor interfaces; Local DOS for semiconductor/Al interfaces; DOS as a function of position and local DOS for the GaSb/Al interface; SBH calculations using the electrostatic potential alignment method; Local DOS for tri-layer interfaces; DOS as a function of position for tri-layer interfaces with additional barrier thickness values.
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Title
Partial bulk calculations data and files
Description
Contains the partial data, inputs to VASP, plotting scripts, outputs for the bulk calculations
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Title
Partial slab calculations data and files
Description
Contains the partial data, inputs to VASP, plotting scripts, outputs for slab calculations
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