Abstract
Reflectron-based time-of-flight analyzers rely on sub-nanosecond detector time response to achieve acceptable resolving power for low-mid mass, multiple ion peaks. With the adoption of multi-reflection analyzers, order of magnitude longer folded ion paths relax restrictions on detector response time, allowing implementation of new technologies that greatly improve dynamic range, detector lifetime, and ion detection efficiency. A detection system is presented, integrated into the Astral analyzer, that combines 10 keV post-acceleration and focal plane correction with a unique BxE focusing, optically coupled detector, pre-amplification and dual channel digitization. Calibration and peak handling methods are also described. The instrument demonstrated >1x104 dynamic range in a single shot, >100k resolving power, and a relative immunity to detector ageing.
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Supporting Information
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The supporting information covers additional details of the hardware, simulation and experiments.
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