Dark State Concentration Dependent Emission and Dynamics of CdSe Nanoplatelet Exciton-Polaritons

05 March 2024, Version 1
This content is a preprint and has not undergone peer review at the time of posting.

Abstract

The recent surge of interest in polaritons has prompted fundamental questions about the role of dark states in strong light-matter coupling phenomena. Here, we systematically vary the relative number of dark state polaritons by controlling the number of stacked CdSe nanoplatelets confined in a Fabry-Pérot cavity. We find the emission spectrum to change significantly with an increasing number of nanoplatelets, with a gradual shift of the dominant emission intensity from the lower polariton branch to a manifold of dark states. Through accompanying calculations based on a kinetic model, this shift is rationalized by an entropic trapping of excitations by the dark state manifold, while a weak dark state dispersion due to local disorder explains their non-zero emission. Our results point towards the relevance of the dark state concentration to the optical and dynamical properties of cavity-embedded quantum emitters with ramifications for Bose- Einstein condensate formation, polariton lasing, polariton-based quantum transduction schemes, and polariton chemistry.

Keywords

Polaritons
CdSe Nanoplatelets
Dark States
Optical Cavity
Kinetic Model
Quantum Emitters

Supplementary materials

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Title
Supplementary Information: Dark State Concentration Dependent Emission and Dynamics of CdSe Nanoplatelet Exciton-Polaritons
Description
The supporting information includes further synthetic details and a characterization of the CdSe NPLs, the fabrication of the NPL-cavity device, a schematic of the NPL film formation procedure, scanning tunneling electron microscopy (STEM) images of a single the CdSe NPL film layer showing their typical face down orientation within the cavity, analysis of the nanostructral uniformity of the NPLs from STEM images, details and a schematic of the Fourier spectroscopic set-up used for reflectance and emission measurements, details on the determination of the cavity linewidth, the angle dependence of the bare exciton reflectance and emission profiles, angle resolved reflectance measurements for X = 1 through 5, duplicate reflactance measurements, and comparison of experimental and simulated angle dependent emission for X = 2 through 4. It also includes the polaritonic Hamiltonian and a derivation of the phonon mediated exciton-polariton rate equation used in the kinetic model.
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