Simultaneous Electrochemical Exfoliation and Functionalization of 2H-MoS2

21 July 2023, Version 2
This content is a preprint and has not undergone peer review at the time of posting.

Abstract

MoS2 is a promising semiconducting material that has been widely studied for applications in catalysis and energy storage. The covalent chemical functionalization of MoS2 can be used to tune the optoelectronic and chemical properties of MoS2 for different applications. However, 2H-MoS2 is typically chemically inert and difficult to functionalize directly and thus requires pre-treatments such as a phase transition to 1T-MoS2 or argon plasma bombardment to introduce reactive defects. Apart from being inefficient and inconvenient, these methods can cause a degradation of the desirable properties and introduce unwanted defects. Here, we report a facile and scalable procedure of fabricating functionalized thin (~4 nm) MoS2 layers. We demonstrate that 2H-MoS2 can be simultaneously electrochemically exfoliated and functionalized. The aryl diazonium salts used for functionalization have not only been successfully grafted onto the 2H-MoS2, as verified by X-ray photoelectron spectroscopy (XPS) and Raman spectroscopy, but also aid the exfoliation. Electrochemical characterization of MoS2 supercapacitors revealed that the specific capacitance of electrodes produced using this material was increased by 25% when functionalized. This electrochemical functionalization technique could possibly be extended to other types of transition metal dichalcogenides (TMDs), which are also chemically inert, with different functional species to adjust to specific applications.

Keywords

exfoliation
MoS2
chemical functionalization

Supplementary materials

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Supporting Information
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AFM images of EEM and EEG. Histograms of flake size distributions for EEM, EEG and fct-EEG. Representative Raman spectrum for fct-EEG and EEG. Histograms of intensity ratios of D and G peak for EEG and fct-EEG. XRD patterns for graphite, EEG and fct-EEG. E12g peak position versus A1g peak position for fct-EEM and EEM. Representative Raman spectrum for fct-EEM and EEM. CV scans for fct-EEM/fct-EEG composites of a weight ratio of 3:1. Specific capacitances of fct-EEM/fct-EEG of a weight ratio of 1:3 versus current densities. Trasatti method for the calculation of capacitance contributions. SEM images of MoS2 crystals before and after exfoliations. Schematics of the production procedures.
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