Abstract
Mechanical exfoliation methods of two-dimensional materials have been an essential process for advanced device and fundamental sciences. However, the exfoliation method usually generates various thick flakes, and a bunch of thick bulk flakes usually covers an entire substrate. Here, we developed a method to selectively isolate mono- to quadlayers of transition metal dichalcogenides (TMDCs) by sonication in organic solvents. The analysis reveals the importance of low interface energies between solvents and TMDCs, leading to effective removal of bulk flakes under sonication. Importantly, a monolayer adjacent to bulk flakes shows cleavage at the interface, and the monolayer can be selectively isolated on the substrate. This approach can extend to preparing a monolayer device with crowded 17 electrode fingers surrounding the monolayer and for the measurement of electrostatic device performance.
Supplementary materials
Title
Supplementary information
Description
Optical microscope images, the characterization of samples, the detailed information on MOSFET devices.
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Title
Supplemental movie
Description
Observation of dispersed bulk flakes.
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