Abstract
Fabrication of metal-organic framework (MOF) thin films rigidly anchored on suitable substrates is a crucial prerequisite for the integration of these porous hybrid materials into electronic and optical devices. Thus far, the structural variety for MOF thin films available through layer-by-layer deposition was limited, as the preparation of those surface-anchored metal-organic frameworks (SURMOFs) has several requirements: Mild conditions, low temperatures, day-long reaction times, and non-aggressive solvents. We herein present a fast method for the preparation of the first MIL SURMOF on Au-surfaces under rather harsh conditions: Using a dynamic layer-by-layer synthesis for MIL-68(In), thin films of adjustable thickness between 50-2000 nm could be deposited within only 60 min. The MIL-68(In) thin film growth was monitored in-situ using a quartz crystal microbalance. In-plane X-ray diffraction revealed oriented MIL-68(In) growth with the pore-channels of this interesting MOF aligned parallel to the support. SEM data demonstrated an extraordinarily low roughness of the MIL-68(In) thin films. Mechanical properties and lateral homogeneity of the layer were probed through nanoindentation. These thin films showed extremely high optical quality. By applying a PMMA layer and further depositing an Au-mirror to the top, a MOF optical cavity was fabricated that can be used as Fabry-Perot interferometer. The MIL-68(In)-based cavity showed a series of sharp resonances in the UV-Vis regime. Changes in the refractive index of MIL-68(In) caused by exposure to volatile compounds, led to pronounced position shifts of the resonances. Thus, these cavities are well suited to be used as optical read-out sensors.
Supplementary materials
Title
MIL-68 Flow Sensor Working SI
Description
Detailed Experimental Section
1. General Information – Materials and Methods
1.1 Materials
1.2 Calculating the mass of thin film during the synthesis of MIL-68(In) SURMOF
1.3 UV/Vis spectroscopy 6
1.4 In-plane and out-of-plane x-ray diffraction
1.5 Nano-Indentation
1.6 Scanning Electron Microscopy (SEM)
1.7 Light and Confocal Microscopy
1.8 Determination of cavity modes using Refdex
2. References
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