Beyond the Meso-/Macroporous boundary: Extending Capillary Condensation-based Pore Size Characterization in Thin Films Through Tailored Adsorptives

05 December 2023, Version 1
This content is a preprint and has not undergone peer review at the time of posting.

Abstract

The characterization of thin films containing nanopores with diameters exceeding 50 nm poses significant challenges, especially when employing sorption-based techniques. Conventional volumetric physisorption or mercury intrusion methods have limited applicability to thin films, considering factors such as sample preparation time and the need for non-destructive testing. In this context, ellipsometric porosimetry (EP), represents a viable alternative. Its optical principle is highly sensitive to thin layers, offering insights into diverse structural parameters such as surface area, pore size, and porosity. While existing setups rely on capillary condensation of volatile compounds (such as water), their applicability is typically restricted to pore dimensions < 50nm. In this study, we introduce two high-molecular-weight hydrocarbon adsorptives, namely ethylbenzene and n-nonane to EP. These adsorptives show great promise in enhancing the accuracy of physisorption measurements beyond mesoporosity (>50 nm), extending the applicability up to 80 nm pores. The measurement guidelines established herein offer a non-destructive, expeditious (<60 min), low-pressure (<0.03 Bar) approach for investigating nanoporous thin films, with potential for adaptation to diverse structural architectures.

Keywords

ellipsometric porosimetry
mesoporosity
macroporosity
thin films
capillary condensation
anodic aluminium oxide

Supplementary materials

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Title
Supporting Information for manuscript - Beyond the Meso-/Macroporous boundary: Extending Capillary Condensation-based Pore Size Characterization in Thin Films Through Tailored Adsorptives
Description
Supporting information that contains: - Detailed sample preparation procedures - Overview of physicochemical properties of adsorptives for physisorption - Top view electron micrographs of the three model architectures - Ellipsometric spectra of samples - Spectroscopic refractive index values - Calculated thickness-relative pressure relationships of adsorbed multilayers of various adsorptives
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